D2DB-PM Application

Take line monitoring to the next level with Die-to-Database Pattern Monitor.

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D2DB-Image Explorer Toolkit

Create custom solutions by integrating Anchor's powerful vendor-neutral image processing technology.

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Pattern Centric Yield Manager Application

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Pattern Centric Machine Learning Toolkit

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More Products Toolkit

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Applications

D2DB-PM. Die to Database Pattern Monitor.
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PCYM. Pattern Centric Yield Manager.
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PCML: Pattern Centric Machine Learning.
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PWA. Process Window Analyzer.
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Toolkits

Toolkits are composed of core engines that customers can use to develop their own automated workflows.

D2DB-Image Explorer.
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ADD. Advanced Defect Discovery.
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I2DC. Image to Design Contour.
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News

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Latest Papers

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resources/PDF/Net-Tracing-for-DVC-Defects.pdf,[iframe]

Net Tracing and Classification Analysis on E-Beam Die-to-Database Inspection.

Abstract Only. Please Contact Us for full transcript.

SPIE Vol. 9778 (2016)


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resources/PDF/Design-guided-data-analysis-for-process-window.pdf,[iframe]

Design Guided Data Analysis for Summarizing Systematic Pattern Defects and Process Window.

Abstract Only. Please Contact Us for full transcript.

SPIE Vol. 9778 (2016)


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resources/PDF/Automatically-High-Accurate-and-Efficient-Photomask-Defects-Management-Solution-for-Advanced-Lithography-Manufacture.pdf,[iframe]

Automatic High Accurate and Efficient Photomask Defects Management Solution for Advanced Lithography Manufacture.

SPIE Vol. 9050-62 (2014)


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Featured Product

D2DB Pattern Monitor

Take line monitoring to the next level with Die-to-Database Pattern Monitor. Tap the full potential of SEM images in ways that redefine production line monitoring for advanced technology nodes.
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Technology

Computational System.
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Parametric Rule Editor.
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Image Processing.
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NanoScope PRV.
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